Model |
CRX-60 |
CRX-62 |
CRX-66 |
Geometry* |
45/0 |
||
Repeatability** |
dE*ab≤0.1 |
dE*ab≤0.05 |
dE*ab≤0.02 |
Inter-instrument agreement*** |
/ |
/ |
dE*ab≤0.25 |
Display accuracy |
0.01 |
||
Measuring/Lighting calibers |
Φ8mm/Φ21mm |
||
Measurement index |
CIE-Lab,XYZ |
Light source condition,
CIE-Lab,CIE-LCh,HunterLab,CIE-Luv,XYZ,Yxy, RGB,chromatic aberration(ΔE*ab,ΔE*cmc,ΔE*94,ΔE*00),whiteness(ASTM E313-00,ASTM E313-73,CIE,ISO2470/R457,AATCC, Hunter,Taube Berger Stensby),yellowness(ASTM D1925, ASTM E313-00,ASTM E313-73),blackeness(My,dM), color fastness,color fastness,Tint(ASTM E313-00), color densityCMYK(A,T,E,M) |
|
Light source condition |
A,C,D65 |
A,B,C,D50,D55,D65,D75,F1,F2,F3,F4,F5,F6,F7,F8,
F9,F10,F11,F12,CWF,U30,U35,DLF,NBF,TL83,TL84, ID50,ID65,LED-B1,LED-B2,LED-B3,LED-B4,LED-B5, LED-BH1,LED-RGB1,LED-V1, LED-V2 |
|
Lighting source |
Full band balancedLED light source | ||
Field angle |
2°,10° | ||
Meet a criterion |
CIE No.15,GB/T 3978,GB 2893,GB/T 18833,ISO7724-1,ASTM E1164,DIN5033 Teil7 | ||
Spectroscopic method |
Nanobeam splitting device |
Raster |
|
SenSor |
Silicon optical array device |
Dual-row high-precisionCMOS array sensor |
|
Wavelength interval |
10nm |
||
Wavelength coverage |
400-700nm |
||
Reflectance measurement range |
0-200% |
||
Reflectance resolution |
0.01% |
||
Measurement and observation mode |
Visual |
||
Calibration |
Intelligent automatic calibration |
||
Accuracy guarantee |
Ensure the first level of measurement |
||
Measuring time |
Single measurement 110ms |
Single measurement50ms |
|
Measuring interval |
1s | ||
Port |
USB,485,232,External trigger, analog output, Ethernet |
||
Screen |
No | Full color screen,3.5 inches | |
Light source lifetime |
1 million times in 10 years | ||
Language |
/ | Simplified Chinese, English | |
Non-contact distance |
5mm |
*45°Angle ring lighting/0°Angle reception
**The whiteboard was calibrated to measure 30 standard deviations at 5-second intervals
***The average value of BCRA Series II 12 swatches was measured